Researchers able to study individual defects in transistors
Scientists have developed a method for studying individual defects in transistors. All computer chips, which are each made up of huge numbers of transistors, contain millions of minor ‘flaws’. Previously it was only possible to study these flaws in large numbers. However, fundamental research has now made it possible to zoom in on defects and study them individually. In due course, this knowledge will be highly relevant to the further development of the semiconductor industry.
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